“…revised and extended…an essential book for those interested in knowing more about the subject.” (Measurement and Control, Vol.38, No.2, March 2005)
"If you were wondering what microoptics actually is or how it is specifically defined, then this book not only provides the answer but represents a valuable insight into the subject today as well... In response to my own question, the book does achieve its aims - an overview of a rapidly changing subject, with basic theory and a good applications focus. It is an essential book for those interested in knowing more about the subject and as such is a good, albeit expensive, buy." (Measurement + Control)
Microoptics is an important enabling technology for many areas of application. In this updated second edition of their modern text and reference book, Stefan Sinzinger and Jürgen Jahns expertly and comprehensively present the basics and applications in microoptics, while incorporating the most important developments in recent years.
An absolute must for physicists and electrical engineers, from advanced students right up to designers working in the field.
About the Author
Stefan Sinzinger studied physics at the University of Erlangen-Nürnberg from where he also received his doctorate degree in 1993. In 1991 he spent 9 months at the NEC Research Institute in Princeton, NJ, USA. From 1994 to 2002 he worked as research scientist for Jürgen Jahns at the University of Hagen on planar optical systems integration. In April 2002 he became Professor for "Technische Optik" (Optical Engineering) at the Technical University of Ilmenau. His current research interest is the use of microstructures for the optimisation of optical components and systems.
Jürgen Jahns received his degree in physics from the University of Erlangen-Nürnberg, Germany. After eleven years in industry at Siemens, Munich, and AT&T Bell Laboratories, Holmdel (NJ), he became a Professor for Optical Information Technology at the University of Hagen, Germany. Focus of his work is the integration of microoptical systems and their application for computing and sensing.