Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

The five chapters that make up this latest volume range over tomography, color image processing, charged particle optics and electron microscopy. We begin with a full and scholarly account of many of the algorithms used for computed tomography, by C. Bontus and T. Köhler. They take the reader systematically through the mathematical foundations and in particular, devote considerable space to the reconstruction algorithm developed by A. Katsevich for helical computed tomography and the various developments engendered by that work. In a second contribution from the same area, G.R. Easley and F. Colonna provide a very learned account of the generalized discrete Radon transform. After a reminder of the classical Radon transform, they introduce wavelets and their descendants—ridgelets, curvelets and shearlets. All these tools are then applied to the Radon transform and various applications are included.