Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.
The starting point for writing this book was a discussion between the two of us about our common experience in our ATE test application support work for high-speed digital interfaces and the challenges these interfaces pose on the test engineers we supported. Initially we just planned to write an extended application note about the nature of jitter and jitter testing. This was due to the fact that we identified this topic as the one that all engineers that in the one or other way have responsibility for getting high-quality high-speed devices out of a fabrication line had most questions about.
However, it became clear to us very soon that just another jitter document would not really satisfy the needs of these engineers because their main difficulty is not necessarily to understand the test theory around jitter. It rather is the transfer of this knowledge about the theory into a practical implementation of device test flows and the various cross dependencies between device building blocks, interface architectures, test system interfacing, integration of external instrumentation, and efficient test implementations for production testing.