Modern Semiconductor Devices for Integrated Circuits, First Edition introduces readers to the world of modern semiconductor devices with an emphasis on integrated circuit applications. KEY TOPICS: Electrons and Holes in Semiconductors; Motion and Recombination of Electrons and Holes; Device Fabrication Technology; PN and...

This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration...

This book provides detailed information on the interconnect RC and layout extraction in integrated circuit chips. The RC and layout extraction is a part of the job in the physical design and timing analysis for high-speed circuit design. The accuracy of interconnects RC model as well as the extracted device sizes from the physical layout are...

Mr. Sorin A. Huss was born in Bukarest, Romania on May 21, 1950. He attended a secondary school with emphasis on mathematic and scientific topics in Dachau near Munich and after his Abitur...

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and...

Welcome to the special issue of the International Journal of High Speed Electronics and Systems on "High-Speed Mixed-Signal Integrated Circuits". Silicon, in particular MOS silicon, has rapidly become the de facto technology for mixed-signal integrated circuit design due to the high levels of integration possible as device...

Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present...