ESD Basics: From Semiconductor Manufacturing to Product Use
Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as...
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice The focused ion beam (FIB) instrument has experienced an intensive period of maturation since its inception. Numerous new techniques and applications have been brought to fruition by the tireless efforts of some very innovative scientists with the foresight to recognize the potential of this upstart apparatus. Over the past few years, the FIB has... Non-Equilibrium Dynamics of Semiconductors and Nanostructures This book consists of recent new developments in the field of ultrafast dynamics in semiconductors and nanostructures. It consists of eight chapters. Chapter 1 reviews spin dynamics in a high-mobility, two-dimensional electron gas. Chapter 2 deals with generation, propagation, and nonlinear properties of high-amplitude, ultrashort strain solitons...
Properties of Semiconductor Alloys: Group-IV, III-V and II-VI Semiconductors The main purpose of this book is to provide a comprehensive treatment of the materials aspects of group-IV, III−V and II−VI semiconductor alloys used in various electronic and optoelectronic devices. The topics covered in this book include the structural, thermal, mechanical, lattice vibronic, electronic, optical and carrier transport... Transmission Electron Microscopy and Diffractometry of Materials
Experimental methods for diffraction and microscopy are pushing the front
edge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective...
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